Apparatus for emulation of electronic systems

ABSTRACT

A system for physical emulation of electronic circuits or systems includes a data entry workstation where a user may input data representing the circuit or system configuration. This data is converted to a form suitable for programming an array of programmable gate elements provided with a richly interconnected architecture. Provision is made for externally connecting VLSI devices or other portions of a user&#39;s circuit or system a network of internal probing interconnections is made available by utilization of unused circuit paths in the programmable gate arrays.

RELATED APPLICATIONS

This application is a continuation of U.S. application Ser. No.09/351,997, filed Jul. 12, 1999, now U.S. Pat. No. 6,377,911 which is acontinuation of application Ser. No. 08/865,559 filed on May 29, 1997,now U.S. Patent No. 5,963,735, which is a continuation of applicationSer. No. 08/478,964 (now abandoned), which is a continuation ofapplication Ser. No. 08/273,513, filed Jul. 11, 1994, now U.S. Pat. No.5,477,475, which is a continuation of application Ser. No. 08/171,348,filed Dec. 21, 1993, now U.S. Pat. No. 5,329,470, which is acontinuation of application Ser. No. 08/071,033, filed May 28, 1993,(now abandoned), which is a continuation of application Ser. No.07/824,341, filed Jan. 23, 1992 (now abandoned), which is a continuationof application Ser. No. 07/279,477, filed Dec. 2, 1988, Now U.S. Pat.No. 5,109,353.

FIELD OF THE INVENTION

The present invention relates to electronic hardware systems. Moreparticularly, the present invention relates to apparatus for emulationof electronic hardware system.

THE PRIOR ART

As electronic components and electronic systems have become morecomplex, the design of these components and systems has become a moretime consuming and demanding task. Recently software simulation ofelectronic components and systems has become an important tool fordesigners. Simulation of a design is the execution of an algorithm thatmodels the behavior of the actual design. Simulation provides theability to analyze and verify a design without actually constructing thedesign and has many benefits in the design process. However, simulationsuffers from three major limitations: the speed of the simulation, theneed for simulation models, and the inability to actually connect asimulation of one part of a design to an actual physical implementationof another part of the design.

Simulation accelerators have come to be used to address the problems ofthe execution speed of simulation. A simulation accelerator uses specialpurpose hardware to execute simulation algorithms in order to achievehigher speeds than can be achieved using general purpose computers. Nonethe less, simulation accelerators still execute an algorithm that modelsthe actual design and consequently remain substantially slower than areal hardware implementation. Accelerators do not in any way obviate theneed for software models of all devices to be simulated.

Physical modeling systems such as the Valid Real Chip or Daisy PMXaddress the problem of the lack of availability of software models forcomplex standard parts. They also address to some degree the speed ofexecution of complex software models. Physical modelers are also used inconjunction with software simulators. The modeling engine and an actualpart plugged into it are used in lieu of a model of that part and areconnected to a simulator which can then use the actual responses of thepart in lieu of a simulation model of the part. The primary innovationsin the arena of physical modeling have been associated with thisconnection between the modeler and the simulator.

Similar design and verification problems that arise with the use ofstandard microprocessors have been addressed through the use ofmicroprocessor in-circuit emulators supplied by a number of companies. Amicroprocessor in-circuit emulator uses an actual microprocessor, or aspecially modified version of the standard microprocessor, combined withspecial purpose instrumentation logic to make the job of debugging adesign easier. A microprocessor in-circuit emulator includes a cablewhich can be plugged into a system in lieu of the actual microprocessorso that the actual system can be run at or near real time duringdebugging.

While all of these techniques provide advantages in the design andverification process, none satisfy all of the needs for designing anddebugging including: near real time operation for non-standard parts,in-circuit emulation for other than standard parts, and freedom from theneed for software models for all devices.

BRIEF DESCRIPTION OF THE INVENTION

An apparatus is disclosed and claimed which aids in the development ofintegrated circuit and system design by quickly and automaticallygenerating a hardware prototype of the integrated circuit or system tobe designed from the user's schematics or net list. The prototype iselectrically reconfigurable and may be modified to represent anindefinite number of designs with little or no manual wiring changes ordevice replacement. The prototype runs at real time or close to realtime speed and may be plugged directly into a larger system. VLSI chipsor ASIC devices may be plugged into the prototype and run as part as theemulated design.

The apparatus of the present invention includes an emulation array,which is an array of an electrically programmable gate arrays used toimplement the necessary logic functions and connect them together into acomplete design. The gate arrays provide both logic implementation andsignal routing between fixed printed circuit board traces. Few or nomanual steps such as wire wrapping, or replacement of PALs are requiredto modify the design.

External cables along with a series of adaptor plugs allow theprogrammable breadboard to be connected directly to an existing systemor printed circuit board. The apparatus of the present inventionreplaces a chip or board as a part of a larger system. Additionaldebugger hardware is included to allow internal nodes of the design tobe probed and the resulting wave forms displayed without requiring theuser to manually move wires. Internal nodes may also be stimulated.

A user supplied netlist or schematic is converted into a correctconfiguration file for use by the apparatus.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 a is a block diagram of a presently-preferred embodiment ofapparatus of the present invention.

FIG. 1 b is a block diagram of a programmable gate array used in thepresently preferred embodiment, shown surrounded by eight of itsimmediate neighbors in the array matrix, illustrating I/O pininterconnections.

FIG. 1 c is a block diagram showing the interconnections betweenprogrammable gate arrays and probe programmable gate arrays in apresently-preferred embodiment of the present invention

FIG. 2 is a block diagram of a portion of the emulation array matrix ofa presently-preferred embodiment showing four programmable gate arraysand showing how an exemplary circuit may be connected using thoseprogrammable gate array chips.

FIG. 3 is a block diagram of a portion of the emulation array showingphysical device emulation and provision for connecting external VLSIdevices to the apparatus.

FIG. 4 is a block diagram of a portion of the emulation array showingelements used for memory device emulation.

FIG. 5 is a block diagram of the interface portion of the presentapparatus which connects the apparatus of the present invention to theuser's system.

FIG. 6 is a block diagram of logic analyzer and pattern generator foruse with the present invention.

FIG. 7 is a block diagram of an example of the use of the probing logicof the present invention.

FIG. 8 is a block diagram of the contents of configuration unit 14 ofFIG. 1 a.

FIG. 9 is a flow diagram of a presently preferred routine for loadinginformation into the programmable gate arrays.

FIG. 10 is a diagram of the software routines which may be utilized in apresently-preferred embodiment.

FIGS. 11 a-e are flow diagrams of software routines for accomplishingsystem partitioning of circuit elements according to apresently-preferred embodiment of the present invention.

DETAILED DESCRIPTION OF A PREFERRED EMBODIMENT

A preferred embodiment of the apparatus of the present invention isdepicted in FIG. 1 a. Emulation apparatus 10 includes a data entryworkstation 12, at which a user enters information describing theelectronic circuit or system which it is desired to emulate.Configuration information created by the data entry work station 12 ispassed to configuration unit 14. Configuration unit 14 contains thecircuitry necessary to accomplish the programming of the programmablegate arrays which are contained within emulation array 16.

The heart of the system of the present invention is emulation array 16.Emulation array 16 includes a plurality of programmable gate arraydevices 18. The programmable gate array devices 18 are arranged in amatrix. For illustrative purposes only, emulation array 16 of FIG. 1 isshown as a 3×3 matrix containing 9 total gate arrays, denoted byreference numerals 18 a-18 i. Those of ordinary skill in the art willreadily recognize that the 3×3 array depicted in FIG. 1 is forillutration only and that, in an actual embodiment, the size ofemulation array 16 is limited only by simple design choice.

In an actual implementation, emulation array 16 may be a threedimensional array and, in a presently preferred embodiment, consists ofa plurality of circuit boards each containing a matrix of individualprogrammable gate array integrated circuit devices 18. In a presentlypreferred embodiment, each card contains a 6×6 matrix of programmablegate arrays 18. In the presently-preferred embodiment, an additional rowof 6 programmable gate arrays exists on each card for use in testprobing.

In a presently preferred embodiment, programmable gate array integratedcircuit devices 18 may be XC3090 integrated circuits manufactured byXilinx Corporation of San Jose, Calif. These integrated circuits andtheir use are described in the publication Programmable Gate Array DataBook, Publication No. PN0010048 01 which is expressly incorporatedherein by reference.

The I/O pin wiring in between programmable gate array chips 18 in thepresent invention is illustrated with respect to FIG. 1 b. FIG 1 b showssix programmable gate arrays in a matrix. The programmable gate array inthe center, reference numeral 18 x, is shown having connections to itsneighbors.

Each one of the programmable gate arrays 18 has a fixed number of itsinput/output (I/O) pins wired to a backplane. These I/O pins are usedfor intercard wiring, and inclusion of VLSI integrated circuits to beincluded in the emulated circuit. In a presently preferred embodiment,twenty-eight I/O pins on each gate array 18 x are wired to a back planeand are used for inclusion of VLSI devices in the emulated circuit.These same I/O pins may be connected, fourteen each, to correspondingprogrammable gate arrays (i.e., those in corresponding positions) on thecircuit boards immediately above and below the board containingprogrammable gate array 18 x. These are denoted by the up and downarrows indicating fourteen lines, reference numerals 19 a and 19 b. TenI/O pins on each gate array 18 are dedicated to the input/output linesof the emulated system, (not shown in FIG. 1 b) and nine I/O pins areused for probing internal nodes (not shown in FIG. 1 b).

The remaining ninety-six I/O pins on each gate array 18 are used tointerconnect to input/output pins on other programmable gate arrays inthe matrix. In a presently-preferred embodiment, eighteen I/O pins(reference numerals 19 c-f) are connected to each adjacent programmablegate array. Four I/O pins are connected to a global four bit busconnecting all gate arrays, four I/O pins are connected one each to thegate arrays in the corners of the matrix (reference numerals 19 g-j) andfour I?O pins in each horizontal and vertical direction (referencenumerals 19 k-n) leapfrog; i.e., are connected to the chip once removed.

To increase the richness of the interconnect possibilities of theemulation array of the present invention, the interchip connections are“wrapped around” the ends of the matrix. This means that, for instance,I/O pins of the programmable gate array chip 18 a in FIG. 1 a areconnected to the I/O pins on the programmable gate array chip 18 c, I/Opins on the programmable gate array 18 d are connected to I/O pins onthe programmable gate array chip 18 f, and I/O pins on the programmablegate array chip 18 g are connected to I/O pins on the programmable gatearray chip 18 i.

Likewise, I/O pins on the programmable gate array chip 18 a, areconnected to I/O pins on the programmable gate array chip 18 g, I/O pinson the programmable gate array chip 18 b are connected to I/O pins onthe programmable gate array chip 18 h, and I/O pins on the programmablegate array chip 18 c are connected to I/O pins on the programmable gatearray chip 18 i.

In a preferred embodiment of the system of the present invention, theemulation array 16 is a three dimensional array, and is composed of aplurality of cards each containing a 6×6 matrix. The intercard techniqueis extended in the vertical third dimension such that I/O pins on theprogrammable gate arrays on one level of the matrix on a given card haveconnections to I/O pins on the corresponding programmable gate arrays onthe cards immediately above and below. In addition, connections from thearrays on the top card are wrapped around to corresponding arrays on thebottom card. In this manner, the richest possibility of interconnectsand routing choices is presented.

Data entry work station 12 may be a presently-available work stationsuch as those manufactured by Daisy, Mentor, and Valid Logic. Data entryworkstation 12 generates a gate level net list from data input by theuser in the manner well known in the art. Using several softwareprograms, the operation of which is disclosed infra, data entryworkstation 12 produces a set of files necessary to program theinterconnections and logic functions within each of the programmablegate array chips in emulation array 16, probing logic section 20, logicanalyzer/pattern generator 22 and interface 25. Configuration unit 14then configures the system using the files produced by data entryworkstation 12.

Probing logic section unit 20 includes a plurality of probing logicprogrammable gate arrays which, in a preferred embodiment, per circuitboard, are equal in number to one of the dimensions of the matrix percard. As illustrated in FIG. 1 c, six probing logic programmable gatearrays are utilized in the presently preferred embodiment where thematrix is a 6×6 matrix. These gate arrays have I/O pin interconnectionsto each of the programmable gate arrays in the matrix column locatedadjacent to these arrays. For example, the first probing logic array hasa number of interconnections to programmable gate arrays 18 a, 18 d, and18 g of FIG. 1 a.

In a presently preferred embodiment, fifty-four I/O connections on eachof the probing logic programmable gate arrays are provided to the sixprogrammable gate arrays in the column of the matrix above it, nine ofthese connections per programmable gate array. In addition, each probinglogic programmable gate array has connections to others. In this manner,a probing logic programmable gate array may be connected to any of theother programmable gate arrays in the entire matrix.

Probing logic unit 20 provides a means of connecting the logicanlayzer/pattern generator 22 to the desired nodes in the designcontained in the emulation array 16. Configuration unit 14 makes theconnections between probing logic 20 and logic analyzer/patterngenerator 22. The pattern generator provides signals to the designconfigured in and running in emulation array 16 and the logic analyzermonitors circuit activity in the design.

The emulation array 16 connects to the user's external system 24, suchthat the protion of the external system which is being emulated by theemulation array 16 may actually be connected into the user's externalsystem 24. One or more VLSI devices, shown at reference number 26, mayalso be incorporated into the design being emulated by system 10. Inaddition to VLSI devices, other circuit functions utilizing discretecomponents and/or integrated circuits, may be placed in referencenumbers 26. Provision is made for incorporated these devices byproviding a number of I/O pin connections from the programmable gatearrays 18 out to a circuit card upon which the one or more VLSI devices,such as microprocessors and the like may be located. Outboard devicesplaced at reference number 26 may be placed there because they cannot,for one or more reasons, be effectively implemented in the array. Highspeed or analog circuits are two such examples.

Additionally, memory devices shown at reference numeral 28 in FIG. 1 maybe connected into the emulation array. The preferred configurations ofthe VLSI devices 26 and the memory devices 28 will be explained withrespect to FIGS. 3 and 4 respectively.

Referring now to FIG. 2, a portion of the emulation array 16 of thesystem 10 of the present invention is shown to include programmable gatearray devices 18 a, 18 b, 18 d, and 18 e, interconnected as they wouldbe in the matrix. In the example shown in FIG. 2, an AND-gate 30 isshown in programmable gate array 18 e, having its first input connectedthrough conductor 32 on programmable gate array 18 a, conductor 34 inbetween gate arrays 18 a and 18 b conductor 33 in gate array 18 b, andconductor 36 in between gate arrays 18 b and 18 e. A second input toAND-gate 30 is connected via conductor 38 in programmable gate array 18d and conductor 40 between programmable gate array 18 d and 18 e. Theoutput of AND-gate 30 is connected to conductor 42 out of programmablegate array 18 e. The connections in between programmable gate arraychips, i.e., 34, 36 and 40, are hard wired, preferably by means ofprinted circuit board traces, while internal connections in programmablegate array chips, i.e., 32, 33 and 38, are made by means of theconfiguration information loaded into them by configuration unit 14.

Those of ordinary skill in the art will readily recognize that theexample shown in FIG. 2 is a simplified example for illustrativepurposes only and that in an actual circuit emulation, programmable gatearrays 18 a, 18 b, 18 d, and 18 e shown in FIG. 2 will contain morelogic functions and will be much more richly connected. In fact, onceconfigured, the emulation array will contain the entire circuit to beemulated, with the exception of any VLSI components, which may beexternally connected to the emulation array as shown with respect toFIG. 3.

Referring now to FIG. 3, VLSI devices 26 a and 26 b are shown connectedto emulation array 16 via a plurality of conductors 44 a-g and 46 a-g.In addition, bus 48 is shown connected both to each VLSI device and toemulation array 16. Bus 48 is provided for bus architecture orientedVLSI devices such as microprocessors, having address and data busses,etc.

Those of ordinary skill in the art will readily recognize that the VLSIdevices 26 a and 26 b are shown illustratively connected to emulationarray 16 with only seven signal lines 44 a-g and 46-a-g and bus 48,respectively. In practice, any number of single signal connections maybe made to these devices, the exact number being a matter of designchoice based upon the maximum likely number of such connections whichwould be needed as well as the total number of signal lines availablefor the devices.

Referring not to FIG. 4, a presently-preferred embodiment of a memorydevice emulation circuit is shown. Memory devices 50 a, 50 b, and 50 care shown having their address, data and control lines connected to aprogrammable gate array device 18 in emulation array 16. Thus, addressbusses 52 a, 52 b, and 52 c of memory devices 50 a, 50 b, and 50 crespectively are shown connected to programmable gate array device 18 asare data lines 54 a-c and control lines 56 a-c. Master address bus 58,master data bus 60 and master control bus 62 connect from programmablegate array 18 to the emulation array 16. By the appropriate programmingof the interconnects in the programmable gate array matrix 16 the memorydevices 50 a, 50 b, and 50 c in the circuit of FIG. 4, may be configuredto emulate memory arrays of varying widths and depths as required by thecircuit being emulated.

As will be appreciated by those of ordinary skill in the art, the memorydevices 50 a, 50 b, and 50 c can be virtually any type of memory. Thenumbers of address data and control lines will vary with size and typeof memory and those of ordinary skill in the art will have no difficultyrealizing how to configure a memory emulation array as depicted in FIG.4 using any type of memory chips.

Referring now to FIG. 5, the interface between the emulation array 16and the users external system 24 will be described. The interface unit(reference 25 of FIG. 1) may be configured from a programmable gatearray 70. Programmable gate array 70 may also be a Xilinx XC3090programmable gate array integrated circuit. The function of theprogrammable gate array 70 will be to provide signal mapping between theemulation array 16 and the user's external system 24. Programmable gatearray 70 provides connections and signal paths between the plurality ofconductors coming into the programmable gate array 70 on lines 72, andthe lines 74 connecting programmable gate array 70 to the user'sexternal system 24. Another function of the programmable gate array 70to provide buffering of the signals on lines 72 and 74.

A third function of programmable gate array 70 is to provide localimplementation of high speed logic. For certain circuit design, theremay be some critical signal paths which, if routed through the emulationarray, would cause system failure because of the time delay associatedwith signal paths involved in the emulation array 16. For such circuits,the critical path logic may be implemented in the interface unit closeto the user s external system to cut down the signal path time and thesignal delay.

A presently-preferred embodiment, line 72 is a 75 ohm cable transmissionline. Those of ordinary skill in the art will recognize that terminationresistors, useful to prevent signal reflections at the ends of thecables should be provided at each end of the transmission lines sincethe line 72 is bi-directional and will be conducting signals in onedirection or another direction depending on the particular design beingemulated.

Referring now to FIG. 6, the logic analyzer and pattern generatorcircuitry of the present invention is seen to include a plurality ofprogrammable gate arrays. In a presently preferred embodiment, a firstdata channel programmable gate array 80 is connected between an I/O bus82 and a plurality of random access memory (RAM) chips 84 a-h. A commonaddress bus 86 is connected to all of the RAM chips 84 a-h from datachannel programmable gate array 80. A data bus 88 is connected from thedata channel programmable gate array 80 to the data inputs of the RAMchips 84 a through 84 f.

A second data channel programmable gate array 90 is connected to the I/Obus 82. A plurality of Ram chips 92 a-h are connected to data channelprogrammable gate array 90 via an address bus 94. A data bus 96 connectsthe second data channel programmable gate array 90 to the data inputs ofrandom access memory chips 92 a-92 f. Together, first and second datachannel programmable gate arrays 80 and 90, and their associated RAMchips 84 a-h and 92 a-h, constitute a data module. The present inventionmay use one or more data modules. In a presently preferred embodiment,there are four data modules.

The data channel programmable gate array 80 and 90 are controlled by acontrol logic programmable gate array 98 which is connected to I/O bus82. Control lines 100 connect control logic programmable gate array 98to data channel programmable gate arrays 80 and 90. A time stamp bus 102connects control logic programmable gate array 98 to the data inputs ofrandom access memories 84 g and h and 92 g and h. The time stamp signalfrom control logic programmable gate array 98 places event timeinformation into random access memories 84 g and h and 92 g and hsimultaneous with data from events being written into random accessmemories 84 a-f and 92 a-f.

Referring now to FIG. 7, the probing logic of a preferred embodiment ofthe present invention is disclosed. The probing logic section 20contains probe programmable gate arrays 110 a, 110 b and 110 c. Probeprogrammable gate arrays 110 a-c are connected to I/O bus 82.

Each of probe programmable gate arrays 110 a, 110 b, and 110 c areconnected to the programmable gate arrays in the emulation array in thecolumn of the matrix above it. Thus, probe programmable gate array 110 ahas connections to emulation array programmable gate arrays 18 a, 18 d,and 18 g; probe programmable gate array 110 b has connections toemulation array programmable gate arrays 18 b, 18 e, and 18 h, and probeprogrammable gate array 110 c has connections to emulation arrayprogrammable gate arrays 18 c, 18 f, and 18 i.

The operation of the probing logic will be shown using exampleillustrated in FIG. 7. Those of ordinary skill in the art will readilyrecognize that FIG. 7 is merely an illustration and the probing logicshown in FIG. 7 is generally applicable.

In the illustration of FIG. 7, emulation array programmable gate array18 a is shown to include a pair of inverters 112 and 114. A line 116 isshown extending from emulation array programmable gate array 18 a toprobe programmable gate array 110 a. Similarly, lines 118 and 1209connect emulation array programmable gate arrays 18 d and 18 g to probeprogrammable gate array 110 a.

In the second column of the matrix of emulation array 16, a D flip-flop122 is shown in emulation array programmable gate array 18 e. Lines 124,126, and 128 are shown connecting emulation array programmable gatearrays 18 b, 18 e, and 18 h, respectively, to probe programmable gatearray 110 b.

In a similarly manner, lines 130 132, and 134 are shown connectingemulation array programmable gate arrays 18 c, 18 f, and 18 i,respectively, to probe programmable gate array 110 c. Those of ordinaryskill in the art will readily recognize that lines 116, 118, 120, 124,126, 128, 130, 132, and 134 are shown as single lines for illustrativepurposes only. In any practical embodiment, a plurality of such linesmay be provided so that multiple points in any of the emulation arrayprogrammable gate arrays can be probed by the probe programmable gatearrays. In a presently preferred embodiment, there are 9 lines connectedfrom each probe programmable gate array to each emulation arrayprogrammable gate array in the column above it.

Returning to the illustrative embodiment of FIG. 7, suppose it isdesired to probe the output of invertor 112. Emulation arrayprogrammable gate array 18 a is programmed, creating a connectionbetween the I/O pin to which line 116 is connected and the nodecomprosing the output of inverter 112 and the input of inverter 114.

Similarly, if the clock input of D flip-flop 122 inside emulation arrayprogrammable gate array 18 e is to be probed, that programmable gatearray is programmed to create a connection between line 126 and theclock input of D flip-flop 122. A second connection is created withinone of the probe PGAs (10 a-c to route the probed signal to one of theI/O Bus Signals.

The programmable gate arrays used in the various protions of the presentinvention are programmed by configuration unit 14. The programming ofthe programmable gate arrays by configuration unit 14 may be bestunderstood with reference to FIG. 8. This discloses one presentlypreferred method of configuring programmable gate arrays. Other methodsare available and are explained in the Xilinx data book.

For purposes of the explanation of configuration unit 14, illustrativeprogrammable gate arrays 150, 152, 154, and 156 are shown in FIG. 8,although it is to be understood by those of ordinary skill in the artthat programmable gate arrays 150, 152, 154 and 156 represent all suchgate arrays in the system and that by understanding the principlesherein disclosed, a particular system configured according to thepresent invention could have an arbitrary number of programmable gatearrays.

Data entry work station 12 of FIG. 1 a may be connected to the standardVME bus well understood by those of ordinary skill in the art. VME bus158 in FIG. 8 is the bus connected to the output of data entry workstation 12. The VME bus 158 is connected to serial to parallel converter160, and to address latch 172 and to Strobe generator 164. The output ofaddress latch 172 is address bus 174, which is connected to strobedemultiplexer 162, clock demultiplexer 166, and verify demultiplexer170.

The serial output and serial input of serial/parallel converter 160 areconnected to the data inputs and the data outputs, respectively, ofprogrammable gate arrays 150, 152, 154, and 156. Strobe demultiplexer162, connected on one end to address bus 174, has an output for each ofthe programmable gate arrays 150, 152, 154, and 156. Verifydemultiplexer 170 is likewise connected on one end to address bus 174and has an output for each of programmable gate arrays 150, 152, 154,and 156. Both strobe demultiplexer 162 and verify demultiplexer 170 areconnected to strobe generator 164. The function of strobe generator 164is to provide an edge-activated strobe signal which either strobedemultiplexer 162 or verify demultiplexer 170 will route to theappropriate one of the programmable gate arrays 150, 152, 154, or 156.Strobe generator 164 is connected to the DSO data strobe line in the VMEbus 158.

Clock demultiplexer 166 is connected on one end to address bus 174 andhas an output corresponding to each of programmable gate arrays 150,152, 154, and 156. Clock demultiplexer 166 is also connected to clockgenerator 168 which is used to clock the data into programmable gatearrays 150, 152, 154, and 156.

The configuration software which runs in data entry work station 12results in a series o files each of which programs one of theprogrammable gate array chips in the system. Information from thesefiles is transferred to the configuration unit 14 as a plurality ofbytes. A software routine running in the data entry work station directsthe programming of all programmable gate arrays in the system using thehardware of configuration unit 14. Three signals are needed to programthe programmable gate arrays. The first, a clock signal, is decoded froma master clock signal by clock demultiplexer 166. The second signal is astrobe signal, which is an edge triggered strobe and is decoded bystrobe demultiplexer 162. The strobe signal acts as an enable signal tothe selected one of illustrative programmable gate arrays 150, 152, 154,or 156. The third signal used to program the programmable gate arrays isthe data itself, which is sent as a serial data stream. Clockdemultiplexer 166 is necessary because upon system power up, the natureof the presently-preferred programmable gate array devices is such thatthey all are enabled to receive data, thus requiring some selectionprocess to prevent the nonselected programmable gate array chips fromprogramming.

The data entry work station first sends an address across the VME buswhich specifies address latch 172. A data byte is latched into addresslatch 172 and appears on address bus 174. Once the address informationin address-latch 172 is valid, data entry workstation 12 sends a strobesignal over VME bus 158 to strobe generator 164 which then provides thenecessary strobe signal to strobe demultiplexer 162. Strobedemultiplexer 162 routes the strobe signal to the selected one of theprogrammable gate arrays 150, 152, 154, or 156. Data from VME bus 158 isthen loaded into serial/parallel converter 160. The data is then clockedout onto serial out line 176 which is commonly connected to the datainput lines of programmable gate arrays 150, 152, 154, and 156. Theclocking serial/parallel converter 160 is coordinated with the clockingfrom 168, providing the clock signal to clock demultiplexer 166. Theclock signals from clock generator 168, routed via clock demultiplexer166 to the selected one of programmable gate arrays 150, 152, 154, and156 allow the serial data appearing on Sout line 176 of serial/parallelconverter 160 to be taken into the appropriate programmable gate arrayone bit at a time. After serial/parallel converter 160 has been emptied,the VME bus supplies another data byte to serial/parallel converter 160.The clocking of the data into the selected programmable gate array isthen repeated. Each successive data byte is delayed by withholding theVME DTACK signal until the preceding byte has been shifted out of theserial/parallel converter. Another byte is loaded into serial/parallelconverter 160 and clocked into the selected programmable gate arrayuntil all of the data bytes for the selected programmable gate arrayhave been loaded into the array. VME bus 158 then loads another addressinto address latch 172, thus selecting another programmable gate arrayfor programming. This process is repeated until all of the programmablegate arrays in the system have been loaded with information.

After all the programmable gate arrays in the system have been loaded,the information which has been loaded into them may be verified forcorrectness. Verify demultiplexer 170 selects a programmable gate arrayfor verification and provides a strobe signal started by VME bus 158,generated by strobe generator 164 and routed by verify demultiplexer170. Clock 168, routed to the appropriate programmable gate array viaclock demultiplexer 166 clocks serial data out of the data output of theselected programmable gate array and into the Sin input ofserial/parallel converter 160. Once serial/parallel converter 160 hasbeen loaded, its parallel data is placed out onto the VME bus.

This process is completely analogous to the loading process except forthe data direction.

Although the data in and data out connections of programmable gatearrays 150, 152, 154, and 156 are shown connected to a singleserial/parallel converter 176, those of ordinary skill in the art willrealize that both the data in and data out connections of theprogrammable gate arrays may be split and buffered as is known in theart to reduce loading and noise.

Referring now to FIG. 9, a preferred routine for the loading ofinformation into the gate arrays of the present invention is disclosed.First, at step 180, the files to be loaded are inventoried. Next, atstep 182, the first file name is used to generate an address. Next, atstep 184, that address is written into address latch 172. Next, at step186, a strobe signal is generated by writing to strobe generator 164. Atstep 188, a data byte is written into serial/parallel to converter 160.

Next, at step 190, the decision is made whether the data byte justwritten is the last data byte in the file. If is not, step 188 isrepeated. If the data byte just written was the last data byte in thefile, a verify signal is generated by the strobe generator at step 192.Next, at step 194, the data byte is read from the serial/parallelconverter 160. Next, at step 196, it is determined whether the byte justread is the last byte in the file. If not, step 194 is repeated. If itwas the last byte, the data read is compared to the data written at step198.

At step 200 it is determined whether the written data matches the readdata, and if the data does not match an error is reported at step 202.If the data does match, at step 204 it is determined whether the filejust operated on is the last file. If not, the program returns to step182 to process the next file. If so, the program terminates.

Data entry workstation 12 runs several software programs which convertthe information input by the system user into information which may beused directed by configuration unit 14 to program all the programmablegate arrays used in the present invention. An additional softwareprogram is used to control the hardware in configuration unit 14 for thepurposes of both programming and verifing the information in theprogrammable gate arrays. A block diagram of a presently-preferredsoftware structure useful in the present invention is shown in FIG. 10.

Referring now to FIG. 10, a schematics data file 210 is created in dataentry workstation 12 by the user. Netlister 212 converts schematics datafile 210 into netlist file 214. Library file 216 contains informationabout the individual logic components which will be configured into theuser's real circuit or system and which the system of the presentinvention will emulate. Library file 216 may be made up of any number ofindividual component model library files readily available frominformation provided by semiconductor and component manufacturers. Thechoice of which of such library files to incorporate into a systemconstructed in accordance with the present invention is purely a matterof the marketeer's choice, and is in no way within the scope of thepresent invention.

Netlister 212, and library 216 are readily available in commerciallyavailable data entry workstations; however, the library is sometimesprovided in a proprietary format, which must either be converted orsubstituted by a conventional format library. Schematic file 210 is ofcourse, created by the user.

Netlist file 214 is read by netlist parser 218, which places data fromnetlist file 214 into memory.

Information from netlist parser 218 is processed by hierarchical netlistexpander 220 and the resulting data is linked with the data from libraryfile 216 in library linker 222. Parsers, linkers and netlist expandersare well-understood by those of ordinary skill in the art and arestraightforwardly implemented.

The netlist information, linked with the library information by librarylinker 222, is now a gate level net list 224 in a form suitable forfunctional implementation and timing analysis as is well understood bythose of ordinary skill in the art.

The next step, shown at reference numeral 226, is to partition thecircuit to be emulated among the gate arrays in the emulation system. Ina presently preferred embodiment, this may be accomplished by softwaresuch as that disclosed herein with respect to FIGS. 11 a-e.

After partitioning, the next step in the process of configuring is asystem routing, shown at reference numeral 228, which assigns theconnection between circuit elements to available chip to chip wiringresources. This may be accomplished by using a Lee-Moore maze router asdescribed in Lee, C. An Algorithm for Path Connections and itsApplications, IRE Trans, on Electronic Computers. Vec-10 pp. 346-365,September 1961, which is expressly incorporated by reference herein.

Once the gate level netlist has been partitioned on to the programmablegate arrays, the information may be processed by software which producesinformation for programming the gate arrays. This step is shown atreference numeral 230. Such software is available from Xilinx, Inc., ofSan Jose, Calif., and is known as XNF2LCA, APR, and XACT. Thisprocessing produces a set of bit stream files which may be directlyloaded into the programmable gate arrays. The loading of the files intothe programmable gate arrays is disclosed elsewhere herein.

At step 232, timing analysis is performed. In a presently-preferredembodiment, software known as “Motive”, available from Quad DesignTechnology of Camarillo, Calif., may be used.

In a presently preferred embodiment, FIGS. 11 a-e illustrate howpartitioning may be accomplished.

Referring first in FIG. 11 a, at step 250, the total number of gatearray chips are divided into two equal groups called “bins”. Next, atstep 252 the fixed resources, which consist of I/O connections, probesto the circuit, VSLI connections, memory, etc., shown in FIG. 1, forexample, at reference numerals 24, 20 26 and 28, are placed inappropriate bins which are physically located close to the circuitelements to which they will connect.

Next, at step 254 all blocks in the hierarchical net list with a sizegreater than 66% of the bin capacity are expanded. This step breaks uplarge blocks into smaller pieces.

Next, at step 256, all blocks are constructively placed into bins. Thisprocess is described in more detail with reference to FIG. 11 c.

Next, at step 258, the bin placement is iteratively improved. Thisprocess is more clearly described with reference to FIG. 11 d.

Referring now to FIG. 11 b, the placement by block is iterativelyimproved at step 26. This procedure is described in detail withreference to FIG. 11 e. At step 262, the determination is made whetheror not the size of all bins is equal to the size of a chip. If so, theplacement is finished and the program terminates. If not, all blocks inthe hierarchical net list with a size greater than 33% of the smallestbin presently defined are expanded. First, at step 266, a bin, whichthis sub-routine has not yet operated on, is selected. Next, at step268, a determination is made whether the bin size is greater than thechip size. If the bin size is not greater than the chip size, this binis marked as expanded at step 270. If the bin size is greater than thechip size, the bin is expanded.

First, at step 272, all blocks are removed from the bin. Next, at 274the bin is divided into two bins. The division of bins is accomplishedsuch that bins are multiples of chip sizes. For instance, if a bin isthe size of three chips, this step may break the bin into one bin havingthe size of two chips and one bin having size of one chip.

Next at step 276, the fixed resources which were in the old bin areplaced into the two newly-created bins. At 278, the blocks areconstructively placed into the new bins. This procedure is described indetail with reference to FIG. 11 c. Next, at step 280 these new bins aremarked as having been expanded. Next, at step 280 a determination ismade whether there are any more unexpanded bins left. If so, the programreturns to step 266 and repeats. If not, the placement by bin isiteratively improved at step 282. This routine is described in detailwith reference to FIG. 11 d. Next, at step 284, the placement by blockis iteratively improved as shown with respect to FIG. 11 e. After step284, the program returns to step 262 to determine whether the size ofall bins is equal to or greater than the size of the single chip.

Referring now to FIG. 11 c, a subroutine which constructively placesblocks into bins is disclosed. First, at step 286 the unplaced blockwith the most connections to already-placed blocks is selected. Next, atstep 288 the resultant wire length if the block is placed in each bin isestimated. Next, at step 290 the bin having the lowest estimated wirelength and space for the block is picked. Next, at step 292, the blockis placed in this selected bin. Next, at step 294, it is determinedwhether there remain any more unplaced blocks. If not, the subroutineterminates. If so, the routine repeats 286 with respect to one of theseunplaced blocks.

Referring now to FIG. 11 d, the subroutine for iteratively improving thebin placement is disclosed. First, at step 296, a bin is selected, next,at step 298, it is determined whether the bin size or cutset size isgreater than a threshold. The cutset size is equal to the number ofconnections which traverse bin boundaries. The threshold is based on theavailable wires which traverse the bin boundaries. In apresently-preferred embodiments the threshold is 80%. Therefore, ifgreater than 80% of the wires traversing the bin boundaries are used up,the answer is affirmative. If the bin size or cutset size does notexceed the threshold, the decision is made at step 300 whether all binshave been improved. If yes, the subroutine is terminated, if not thesubroutine returns to step 296.

If the bin size or cutset size is greater than the threshold, a blockwithin that bin having the lowest cost to move is picked up at step 302.Choosing which block to move is related to the cutset reduction and sizeof the block. For example, a relatively small block having a largereduction in cutset size if moved is an ideal candidate to move. On theother hand a large block having a small cutset reduction if moved isless than ideal to move.

Next, at step 304, a better available bin with space is sought. Thecriteria for selecting this best bin include whether the block fits intothe bin, whether adding the block would make the cutset exceedthreshold, and whether the bin into which the block is placed, willresult in the lowest overall estimated wire length. Next, at step 306,it is determined whether such a bin with space has been found. If abetter bin with space has been found, the block is moved to a new bin at310. If no better bin with any space has been found the unimproved binhaving the lowest penalty is selected at step 308 and at step 310 theblock is moved to this new bin. The subroutine than returns to step 298.

Referring now to FIG. 11 e, the iterative improvement by blocksubroutine is disclosed. First, at step 312 a block is randomly picked.Next, at step 314, the desired location for that block in a bin ischosen. It is desired to move the block, if at all, towards thedirection in which the block has the most connections. The facts whichare used to make this determination are the desire to minimize thecutset count and to minimize the estimated wire length. If both of thesefactors have already been minimized, there is no need to move the block.

At step 316, the determination is made whether there is enough room inthe desired bin to place the block. If not, the block is not moved andit is determined at step 318 whether there are any more unpicked blocks.If not, the routine ends. If so, it returns to step 312 to randomly pickanother block. If, at step 316 is has been determined that there is roomin the bin for the block, the block is moved to the desired bin at step320. The routine then continues to step 318 at previously described.

While a presently-preferred embodiment of the invention has beendisclosed, those of ordinary skill in the art will be enabled tocontemplate variations from the information given in this disclosure.Such variations are intended to fall within the scope of the presentinvention which shall be limited only by the apended claims.

1. A hardware logic emulation system capable of implementing a digitallogic design, said digital logic design comprised of combinational andsequential logic elements, comprising: a printed circuit board; an arrayof programmable gate array devices arranged in a matrix on said printedcircuit boards, each of said programmable gate array devices adapted toimplement a portion of said digital logic design, and each of saidprogrammable gate array devices comprising a plurality of input/outputpins; a plurality of input/output pin conductors, each of said pluralityof input/output pin conductors forming a part of said printed circuitboard and wherein at least some of said input/output pin conductors areplaced in electrical communications with at least some of saidinput/output pins on each of said programmable gate array devices suchthat at least some of said input/output pins on said programmable gatearray devices are placed in direct electrical communication with otherof said programmable gate array devices; a computer adapted to receiveinput data representative of said digital logic design and to processsaid input data into a form that can be implemented in said plurality ofprogrammable gate array devices.
 2. The hardware logic emulation systemof claim 1 wherein said plurality of programmable integrated circuitscomprise identical types of programmable gate array devices.
 3. Thehardware logic emulation system of claim 1 wherein said computer runs apartitioning program which determines which of said programmable gatearray devices are capable of being reserved for interconnecting othersof said programmable gate array devices.